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Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO  
STC53K Series  
5.0mm x 3.2mm  
Features  
? ± ±10ppm (Frequency Stability) Available  
? Clipped Sinewave  
Applications  
? Base Stations  
? IP Networking  
? (VC)TCXO  
? Cellular and Cordless Phones  
? Tape and Reel  
Part Numbering Guide  
STC 53 K 33 R 48 V E A - 19.440M  
SUNTSU TCXO  
FREQUENCY  
MHz  
COMPENSATION  
BLANK : Digital  
5.0mm x 3.2mm  
A : Analog  
PULLABILITY  
BLANK : TCXO  
E : ± ±2100ppm  
F : ± 810ppm  
CLIPPED SINEWAVE  
TCXO/VCTCXO  
BLANK : TCXO  
V : VCTCXO  
OPERATING  
TEMPERATURE  
RANGE  
07 : 0°C - +70°C  
±6 : -±0°C - +60°C  
±7 : -±0°C - +70°C  
27 : -20°C - +70°C  
38 : -30°C - +85°C  
48 : -40°C - +85°C  
SUPPLY VOLTAGE  
25 : 215V± 5%  
FREQUENCY STABILITY  
G : ± 510ppm  
27 : 217V± 5%  
30 : 310V± 5%  
33 : 313V± 5%  
N : ± 510ppm  
O : ± 215ppm  
P : ± 210ppm  
Q : ± ±15ppm  
R : ± ±10ppm  
COMPLIANT  
Cage Code: 4GUT4  
To customize your parameters contact a Suntsu representative1  
Electrical Parameters  
Units  
Minimum  
Typical  
Maximum  
Remarks  
Frequency Range  
MHz  
6
40  
Frequency Tolerance at +25oC  
Freq1 Stability vs1 Op Temp1  
Freq1 Stability vs1 Supply Voltage  
Freq1 Stability vs1 Load  
ppm  
ppm  
ppm  
ppm  
-±15  
-±10  
-013  
-012  
+±15  
+±10  
+013  
+012  
± Hour after re?ow  
See part numbering guide for options1  
VDD± 5% change1  
± 5% change  
Freq1 Stability vs1 Aging  
Operating Temperature  
Storage Temperature  
Supply Voltage (VDD)  
Current (IDD)  
ppm  
°C  
-±10  
-40  
-55  
+±10  
+85  
+±25  
31465  
2
± Year, ± 31±ppm for ±0 Years  
See part numbering guide for options1  
°C  
V
31±35  
313  
See part numbering guide for options1  
mA  
V
Control Current (VC, VCTCXO)  
0
VDD  
Center Voltage : VDD*50%  
Pullability (VCTCXO)  
ppm  
%
± 510  
± ±210  
±0  
See part numbering guide for options1  
Linearity (VCTCXO)  
Output Load (Clipped Sinewave)  
Output Logic Levels  
k?//pF  
VP-P  
±0//±0  
018  
40  
Symmetry (Duty Cycle)  
%
50  
60  
3
ms  
Start-Up Time  
VC Input Impedance (VCTCXO)  
Phase Noise (Typical) ±0Hz Offset  
Phase Noise (Typical) ±00Hz Offset  
Phase Noise (Typical) ±KHz Offset  
Phase Noise (Typical) ±0KHz Offset  
Phase Noise (Typical) ±00KHz Offset  
k?  
±00  
dBc/Hz  
dBc/Hz  
dBc/Hz  
dBc/Hz  
dBc/Hz  
-85  
-±±5  
-±35  
-±45  
-±50  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Speci?cations are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO  
STC53K Series  
5.0mm x 3.2mm  
Outline Drawing  
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1  
Test Circuit (Clipped Sinewave)  
Waveform (Clipped Sinewave)  
Typical Phase Noise (Measured By Agilent E5052A)  
Frequency - 19.440MHz  
Frequency - 40.000MHz  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Speci?cations are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO  
STC53K Series  
5.0mm x 3.2mm  
Jitter Performance (Measured By Agilent E5052A)  
Frequency - 19.440MHz  
Frequency - 40.000MHz  
Tape And Reel Dimensions  
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1  
3,000pcs/Reel  
Re?ow Pro?le & Part Marking  
Tp (Time At 260°C. 20-40 Sec)  
260  
Rup (Ramp Up, 3°C/Sec Max)  
217  
200  
TI (Time Above 217°C.  
60-150Sec)  
150  
Rdn (Ramp Down,  
6°C/Sec Max)  
Ts (Preheat Time.  
60-180Sec)  
T 25°C to Peak (480Sec Max)  
Time (sec)  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Speci?cations are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO  
STC53K Series  
5.0mm x 3.2mm  
Environmental Speci?cations  
Mechanical Speci?cations  
Temperature Cycling  
MIL-STD-883, Method ±0±0, Condition B  
Mechanical Shock  
MIL-STD-202, Method 2±3, Condition B  
MIL-STD-883, Method 2007, Condition A  
MIL-STD-883, Method ±004  
Fine Leak Test  
MIL-STD-883, Method ±0±4, Condition A  
MIL-STD-883, Method ±0±4, Condition C  
Vibration  
Gross Leak Test  
Moisture Resistance  
Solderability  
MIL-STD-883, Method 2003  
J-STD-020, MSL ±  
Resistance to Solvents  
MIL-STD-202, Method 2±5  
Moisture Sensitivity  
Resistance to Soldering Heat  
MIL-STD-202, Method 2±0, Condition K  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Speci?cations are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301